Graphite Thin Films Production by Laser Ablation.
DOI:
https://doi.org/10.22517/23447214.18771Keywords:
Laser Ablation, Graphite, Graphene Oxide, Raman spectroscopy, UV-Vis spectroscopy.Abstract
Graphite thin films on silicon substrate were synthesized by the fundamental and second harmonics of a Nd : YAG pulsed laser, varying the substrate temperature from 200°C to 500°C . The oxygen gas pressure was of 2x10-5 Torr for all thin films grown. The samples were characterized by Raman and UV-Vis spectroscopy. With Raman spectroscopy the vibrational modes D, G and 2D, were identified. A strong dependence of the Absorbance of samples with substrate temperature was observed. The nanostructure of sample grown at 500°C corresponding to graphene oxide. The average thick of thin films was of 65 nm and 40 nm for fundamental and second harmonics respectively.Downloads
Downloads
-
Vistas(Views): 533
- PDF (Español (España)) Descargas(Downloads): 353
Published
How to Cite
Issue
Section
License
Copyright (c) 2019 Scientia et technica
This work is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.
Copyrights
The journal is free open access. The papers are published under the Creative Commons Attribution / Attribution-NonCommercial-NoDerivatives 4.0 International - CC BY-NC-ND 4.0 license. For this reason, the author or authors of a manuscript accepted for publication will yield all the economic rights to the Universidad Tecnológica of Pereira free of charge, taking into account the following:
In the event that the submitted manuscript is accepted for publication, the authors must grant permission to the journal, in unlimited time, to reproduce, to edit, distribute, exhibit and publish anywhere, either by means printed, electronic, databases, repositories, optical discs, Internet or any other required medium. In all cases, the journal preserves the obligation to respect, the moral rights of the authors, contained in article 30 of Law 23 of 1982 of the Government Colombian.
The transferors using ASSIGNMENT OF PATRIMONIAL RIGHTS letter declare that all the material that is part of the article is entirely free of copyright. Therefore, the authors are responsible for any litigation or related claim to intellectual property rights. They exonerate of all responsibility to the Universidad Tecnológica of Pereira (publishing entity) and the Scientia et Technica journal. Likewise, the authors accept that the work presented will be distributed in free open access, safeguarding copyright under the Creative Commons Attribution / Recognition-NonCommercial-NoDerivatives 4.0 International - https://creativecommons.org/licenses/by-nc-nd/4.0/deed.es license.